X-Ray Diffraction analysis was used to measure stacking fault density and texture transformation in silver films created with electron-beam evaporation techniques. Films were heated during the deposition process to obtain samples with different deposition temperatures. Samples were analyzed using X-Ray Diffraction for texture and fault density in as-deposited states and after intervals of annealing. Analysis of scans reveals fewer faults and less (111) to (100) texture transformation in films deposited at higher
XXXVIII Annual Rochester Symposium for Physics Students, University of Rochester, March 30, 2019.