Development of the Optical Feedback System of an Atomic Force Microscope

dc.contributor.author	Kroening, Heidi
dc.date.accessioned	2018-02-17T18:50:15Z
dc.date.available	2018-02-17T18:50:15Z
dc.date.issued	2018-02-17
dc.description.abstract	A low-cost atomic force microscope (AFM) is under development at Houghton College. Once operating, the AFM will be used to characterize the surface topography of thin metal films, providing image resolution on the order of nanometers. The AFM will be equipped with a modified “Johnny Walker” sample mount to allow for a controlled approach of the sample to the cantilever tip. An optical laser system will be used to image the sample. The beam footprint of a laser reflected off a cantilever oscillating at its resonant frequency will be measured on a Conex PSD9 position sensing detector. A feedback loop written in LabVIEW will control the distance between the cantilever tip and the sample. In order to minimize vibrations, an eddy current and spring dampening system will be implemented.
dc.identifier.uri	https://dspace.houghton.edu/handle/hc/3720
dc.publisher	Houghton College
dc.rights	Authors retain the copyright for all content posted in this repository. This material may not be published, reproduced, broadcast, rewritten, or redistributed beyond the Houghton College community without permission except in accordance with fair use doctrine.
dc.subject	Student Projects
dc.title	Development of the Optical Feedback System of an Atomic Force Microscope

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