Design and Construction of an Interferometer System for the Study of Thin Metal Films
A laser interferometer system is currently under development at Houghton College for thin metal film analysis. Films are produced by thermal evaporation under high vacuum. In order to measure the curvature of the films at elevated temperatures, the laser interferometer generates a topographical map of each film using a three-inch diameter collimated beam of light and several optics components. The interferometer will be attached directly underneath the deposition chamber, allowing for the films to be measured without breaking vacuum. Using the relationship between curvature and temperature, the stresses of the films can be calculated.
Authors retain the copyright for all content posted in this repository. This material may not be published, reproduced, broadcast, rewritten, or redistributed beyond the Houghton College community without permission except in accordance with fair use doctrine.