A Study of Tailored Oriented Microstructures in Thin Silver Films using Scanning Electron Microscopy (SEM) and Electron Backscatter Diffraction (EBSD)

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dc.contributor.authorLittle, Bethany
dc.contributor.authorHoffman, Brandon
dc.date.accessioned2008-04-05T18:50:15Z
dc.date.available2008-04-05T18:50:15Z
dc.date.issued2008-04-05
dc.description.statementofresponsibilityXXVII Annual Rochester Symposium for Physics Students, University of Rochester (Rochester, NY).
dc.identifier.urihttps://dspace.houghton.edu/handle/hc/3697
dc.publisherHoughton College
dc.rightsAuthors retain the copyright for all content posted in this repository. This material may not be published, reproduced, broadcast, rewritten, or redistributed beyond the Houghton College community without permission except in accordance with fair use doctrine.
dc.subjectStudent Projects
dc.titleA Study of Tailored Oriented Microstructures in Thin Silver Films using Scanning Electron Microscopy (SEM) and Electron Backscatter Diffraction (EBSD)
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