Progress Towards a Cost-Effective Atomic Force Microscope

dc.contributor.author	Yuly, Jonathon
dc.date.accessioned	2016-07-12T18:50:15Z
dc.date.available	2016-07-12T18:50:15Z
dc.date.issued	2016-07-12
dc.description.abstract	Work towards the design and construction of an atomic force microscope (AFM) is underway at Houghton College. In addition to yielding strong educational value, this device is intended to be used in the characterization of surface topography of thin metal films (such as Ag) and other solid state samples. Three separate “Johnny walker” designs have been designed and built, each design being informed by the previous ones. Though movement of any design has yet to be observed, the design and construction of an improved high voltage (~ 1 kV, 500 hz) signal amplification system to drive the piezo-tube legs of the walker should improve the speed and reliability of future testing.
dc.identifier.uri	https://dspace.houghton.edu/handle/hc/3726
dc.publisher	Houghton College
dc.rights	Authors retain the copyright for all content posted in this repository. This material may not be published, reproduced, broadcast, rewritten, or redistributed beyond the Houghton College community without permission except in accordance with fair use doctrine.
dc.subject	Student Projects
dc.title	Progress Towards a Cost-Effective Atomic Force Microscope

Now showing 1 - 1 of 1