Refurbishment of the Houghton College Scanning Transmission Electron Microscope (STEM)

Abstract

Houghton College is refurbishing a JEOL JEM CX-100 Scanning Transmission Electron Microscope (STEM) for the study of thin metal films. The microscope is capable of scanning electron microscopy (SEM), transmission electron microscopy (TEM), electron diffraction, and backscattered electron microscopy, up to 800,000X magnification. The original image capturing system projects the image onto a cathode ray tube (CRT) screen and takes a film exposure of the image. An interface is being developed to read the image from the CRT and manipulate and store it as digital pictures.