The Design and Construction of an X-Ray Diffractometer

dc.contributor.author	Evans, Andrew
dc.date.accessioned	2013-10-22T18:50:15Z
dc.date.available	2013-10-22T18:50:15Z
dc.date.issued	2013-10-22
dc.description.abstract	X-ray diffractometry is an essential technique in the study of microscopic crystals and thin films. A Bragg-Brentano x-ray diffractometer has been designed and is currently under construction to be used in the Houghton College thin-film research lab. The diffractometer will be essential in studying the atomic lattice transitions and any high concentration impurities produced in silver thin films produced at this lab.
dc.identifier.uri	https://dspace.houghton.edu/handle/hc/3742
dc.publisher	Houghton College
dc.rights	Authors retain the copyright for all content posted in this repository. This material may not be published, reproduced, broadcast, rewritten, or redistributed beyond the Houghton College community without permission except in accordance with fair use doctrine.
dc.subject	Student Projects
dc.title	The Design and Construction of an X-Ray Diffractometer

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