The Design and Construction of an X-Ray Diffractometer
Loading...
Date
Authors
Journal Title
Journal ISSN
Volume Title
Publisher
Houghton College
Abstract
X-ray diffractometry is an essential technique in the study of microscopic crystals and thin films. A Bragg-Brentano x-ray diffractometer has been designed and is currently under construction to be used in the Houghton College thin-film research lab. The diffractometer will be essential in studying the atomic lattice transitions and any high concentration impurities produced in silver thin films produced at this lab.
Description
Event
Keywords
Citation
Collections
Endorsement
Review
Supplemented By
Referenced By
Rights
Authors retain the copyright for all content posted in this repository. This material may not be published, reproduced, broadcast, rewritten, or redistributed beyond the Houghton College community without permission except in accordance with fair use doctrine.