The Design and Construction of an X-Ray Diffractometer
X-ray diffractometry is an essential technique in the study of microscopic crystals and thin films. A Bragg-Brentano x-ray diffractometer has been designed and is currently under construction to be used in the Houghton College thin-film research lab. The diffractometer will be essential in studying the atomic lattice transitions and any high concentration impurities produced in silver thin films produced at this lab.
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