Modifications of XRD at Houghton College

Abstract

Modifications and safety features of a 40 kV Bragg–Brentano ?− 2? x-ray diffractometer (XRD) are being completed at Houghton College for the purpose of studying texture transformations in thin metal films. The sample and detector position are controlled by separate stepper motors that drive along a semicircular track. A radiation monitor measures the number of x-ray counts while scanning along the track. Using Bragg’s law, the out-ofplane lattice distance of various crystal orientations is correlated to certain values of 2?. Comparing the area fraction of the integrated peak intensities, the texture of the thin metal film can be determined.