Modifications of XRD at Houghton College

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dc.contributor.authorPhillips, Heather
dc.date.accessioned2018-11-07T18:50:15Z
dc.date.available2018-11-07T18:50:15Z
dc.date.issued2018-11-07
dc.description.abstractModifications and safety features of a 40 kV Bragg–Brentano ?− 2? x-ray diffractometer (XRD) are being completed at Houghton College for the purpose of studying texture transformations in thin metal films. The sample and detector position are controlled by separate stepper motors that drive along a semicircular track. A radiation monitor measures the number of x-ray counts while scanning along the track. Using Bragg’s law, the out-ofplane lattice distance of various crystal orientations is correlated to certain values of 2?. Comparing the area fraction of the integrated peak intensities, the texture of the thin metal film can be determined.
dc.identifier.urihttps://dspace.houghton.edu/handle/hc/3778
dc.publisherHoughton College
dc.rightsAuthors retain the copyright for all content posted in this repository. This material may not be published, reproduced, broadcast, rewritten, or redistributed beyond the Houghton College community without permission except in accordance with fair use doctrine.
dc.subjectStudent Projects
dc.titleModifications of XRD at Houghton College
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