The Design and Construction of an Interferometer for the measurement of Strain in Thin Metal Films

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Date
2010-04-17
Authors
Silvernail, Adam
Hoffman, Brandon
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Houghton College
Abstract
An interferometer is being constructed at Houghton College which will be used to measure the pattern of interference created by the superposition of light waves incident on a thin metal film and a reference mirror. A uniform wavelength 4” collimated beam of light will illuminate an entire sample and the interference pattern will be captured by a CCD. The position of the reference mirror will oscillate via piezo-electric ceramic. Each pixel will be processed individually to produce a topographical image of the sample surface. The resulting superposition data can be used to calculate the curvature of the thin film and from that the stress of the film in real time.
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Event
XXIX Annual Rochester Symposium for Physics Students, University of Rochester, Rochester, NY., April 17, 2010.
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