The Design and Construction of an Interferometer for the measurement of Strain in Thin Metal Films

dc.contributor.author Silvernail, Adam
dc.contributor.author Hoffman, Brandon
dc.date.accessioned 2010-04-17T18:50:15Z
dc.date.available 2010-04-17T18:50:15Z
dc.date.issued 2010-04-17
dc.description.abstract An interferometer is being constructed at Houghton College which will be used to measure the pattern of interference created by the superposition of light waves incident on a thin metal film and a reference mirror. A uniform wavelength 4” collimated beam of light will illuminate an entire sample and the interference pattern will be captured by a CCD. The position of the reference mirror will oscillate via piezo-electric ceramic. Each pixel will be processed individually to produce a topographical image of the sample surface. The resulting superposition data can be used to calculate the curvature of the thin film and from that the stress of the film in real time.
dc.description.statementofresponsibility XXIX Annual Rochester Symposium for Physics Students, University of Rochester, Rochester, NY., April 17, 2010.
dc.identifier.uri https://dspace.houghton.edu/handle/hc/3632
dc.publisher Houghton College
dc.rights Authors retain the copyright for all content posted in this repository. This material may not be published, reproduced, broadcast, rewritten, or redistributed beyond the Houghton College community without permission except in accordance with fair use doctrine.
dc.subject Student Projects
dc.title The Design and Construction of an Interferometer for the measurement of Strain in Thin Metal Films
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