The Design and Construction of an Interferometer for the measurement of Strain in Thin Metal Films

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dc.contributor.authorSilvernail, Adam
dc.contributor.authorHoffman, Brandon
dc.date.accessioned2010-04-17T18:50:15Z
dc.date.available2010-04-17T18:50:15Z
dc.date.issued2010-04-17
dc.description.abstractAn interferometer is being constructed at Houghton College which will be used to measure the pattern of interference created by the superposition of light waves incident on a thin metal film and a reference mirror. A uniform wavelength 4” collimated beam of light will illuminate an entire sample and the interference pattern will be captured by a CCD. The position of the reference mirror will oscillate via piezo-electric ceramic. Each pixel will be processed individually to produce a topographical image of the sample surface. The resulting superposition data can be used to calculate the curvature of the thin film and from that the stress of the film in real time.
dc.description.statementofresponsibilityXXIX Annual Rochester Symposium for Physics Students, University of Rochester, Rochester, NY., April 17, 2010.
dc.identifier.urihttps://dspace.houghton.edu/handle/hc/3632
dc.publisherHoughton College
dc.rightsAuthors retain the copyright for all content posted in this repository. This material may not be published, reproduced, broadcast, rewritten, or redistributed beyond the Houghton College community without permission except in accordance with fair use doctrine.
dc.subjectStudent Projects
dc.titleThe Design and Construction of an Interferometer for the measurement of Strain in Thin Metal Films
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