Effects of Deposition Temperature on Stacking Fault Density, Texture Transformation in Thin Silver Films

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Date
2019-03-30
Authors
Olandt, Sarah
Zhuravlev, Daniil
Hoffman, Brandon
Rogers, Nate
Baker, Shefford
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Houghton College
Abstract
X-Ray Diffraction analysis was used to measure stacking fault density and texture transformation in silver films created with electron-beam evaporation techniques. Films were heated during the deposition process to obtain samples with different deposition temperatures. Samples were analyzed using X-Ray Diffraction for texture and fault density in as-deposited states and after intervals of annealing. Analysis of scans reveals fewer faults and less (111) to (100) texture transformation in films deposited at higher
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XXXVIII Annual Rochester Symposium for Physics Students, University of Rochester, March 30, 2019.
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