The Refurbishment of a STEM

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Date
2012-04-14
Authors
Spencer, Mark
Hoffman, Brandon
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Journal ISSN
Volume Title
Publisher
Houghton College
Abstract
Houghton College is refurbishing a Jeol JEM CX-100 Scanning Transmission Electron Microscope (STEM) for the study of thin metal films. The STEM is capable of SEM, TEM, XRD, electron diffraction, and backscattered electron microscopy, up to 800,000X magnification. A computer program will be developed to read the x and y raster and create and manipulate digital images. To date, most of the work has been invested in restoring the vacuum system and aligning the electron beam.
Description
Event
XXXI Annual Rochester Symposium for Physics Students, Siena College, Loudonville, NY, April 14, 2012.
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Student Projects
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