Design, Construction of a Cost-effective Atomic Force Microscope

Abstract

At Houghton College, a low-cost atomic force microscope (AFM) design is under development. This AFM will be equipped with an eddy current spring dampening system, a modified “Johnny Walker” sample mount which allows the sample to approach the cantilever tip in a controlled way, and a laser system to detect cantilever movement. Linear transistor amplifier circuits will yield a cost-effective means of driving piezo-electric crystal control elements.