Design, Construction of a Cost-effective Atomic Force Microscope

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Date
2015-04-11
Authors
Kroening, Heidi
Yuly, Jonathon
Hoffman, Brandon
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Publisher
Houghton College
Abstract
At Houghton College, a low-cost atomic force microscope (AFM) design is under development. This AFM will be equipped with an eddy current spring dampening system, a modified “Johnny Walker” sample mount which allows the sample to approach the cantilever tip in a controlled way, and a laser system to detect cantilever movement. Linear transistor amplifier circuits will yield a cost-effective means of driving piezo-electric crystal control elements.
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Event
XXXIV Annual Rochester Symposium for Physics Students, SUNY Oswego, Oswege, NY, April 11, 2015.
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