Design, Construction of a Cost-effective Atomic Force Microscope

dc.contributor.authorKroening, Heidi
dc.contributor.authorYuly, Jonathon
dc.contributor.authorHoffman, Brandon
dc.date.accessioned2015-04-11T18:50:15Z
dc.date.available2015-04-11T18:50:15Z
dc.date.issued2015-04-11
dc.description.abstractAt Houghton College, a low-cost atomic force microscope (AFM) design is under development. This AFM will be equipped with an eddy current spring dampening system, a modified “Johnny Walker” sample mount which allows the sample to approach the cantilever tip in a controlled way, and a laser system to detect cantilever movement. Linear transistor amplifier circuits will yield a cost-effective means of driving piezo-electric crystal control elements.
dc.description.statementofresponsibilityXXXIV Annual Rochester Symposium for Physics Students, SUNY Oswego, Oswege, NY, April 11, 2015.
dc.identifier.urihttps://dspace.houghton.edu/handle/hc/3607
dc.publisherHoughton College
dc.rightsAuthors retain the copyright for all content posted in this repository. This material may not be published, reproduced, broadcast, rewritten, or redistributed beyond the Houghton College community without permission except in accordance with fair use doctrine.
dc.subjectStudent Projects
dc.titleDesign, Construction of a Cost-effective Atomic Force Microscope
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